Use EM TESTís innovative, reliable, modular technology to perform any combination of EFT, CWG, AC/DC DIPS, INTERRUPTS and VARIATIONS, COMMON MODE and both AC and IMPULSE MAGNETIC FIELDS. The UCS 500N7 not only represents the most economic solution for full-compliant immunity tests and CE Marking but goes far beyond.
The EM TESTís UCS500N7 is the most cost effective impulse tester for international and North American product test standards, UCS500N7 combines Surge voltages up to 7kV with EFT up to 5kV making it the automatic choice for manufacturers and test labs. Packed with enhanced features UCS500N7 is setup simpler and faster with improved test report capability. Ethernet interface enables control, communication and custom report generation.
EM TESTís UCS500N7 Multi-function EMC Conducted Immunity Test /Transient Test Generator performs tests according to the following specifications:
- Burst (EFT) 5/50 ns
Pulse conforms to IEC/EN 61000-4-4
Pulse conforms to IEC 61000-4-5 (4.1kV up to 5kV)
- Combination wave pulse (CWG) 1, 2/50 - 8/20 μs (Hybrid-Surge pulse)
Pulse conforms to IEC/EN 61000-4-5
- Dips & Drops / Interrupts
conforms to IEC/EN 61000-4-11, IEC/EN 61000-4-29
- Variation test
conforms to IEC/EN 61000-4-11
- Common Mode
conforms to IEC/EN 61000-4-16 Ed.1.2
- Pulsed magnetic field
conforms to IEC/EN 61000-4-9
- Power magnetic field
conforms to IEC/EN 61000-4-8
The EM TESTís multi-function UCS500N7 generator simulates electromagnetic interference effects for immunity testing of conducted EMC tests for CE mark testing, which include Combination Wave/Ringwave, Electrical Fast Transient (EFT)/ Burst/Surge, pulses and Power Quality Testing (PQT). Extensive expansion capabilities enable the system to be configured for a much broader range of applications. Featuring an innovative, modular design, the USC500N7 multifunction generator that simulates electromagnetic interference effects for immunity testing is a versatile system that can be configured for basic testing needs and expanded to meet the needs of sophisticated test laboratories.
For quick, reliable results, standardized test routines are preprogrammed and can be initiated with just a few prompts. Convenient input buttons make each parameterís value highly visible and allow the user to quickly select and modify all settings-even during a test.. Ramp functions can be programmed quickly and easily. Multi-step test procedures can be created and their sequence or parameter values can be changed easily.
The UCS500N7 Test System generates EMC events that can be observed in the low
power distribution system, telecommunication or data lines. The EM TEST UCS500N7 System replicates the following phenomena:
- Electrostatic Discharges (ESD)
A person becomes electrostatically charged by walking over an insulating floor surface.
The capacity of the body can be charged to several kilo-volts and is discharged
when contact is made with an electronic unit or system. The discharge is visible as a
spark in many cases and can be felt by the person concerned, who receives a Ąshock".
The discharges are harmless to humans, but not to sensitive, electronic equipment.
The resulting currents cause interference or even component damage.
- Electric Fast Transients (EFT) / Burst
Industrial measurement and control equipment nearly always use conventional
control units containing relays or other electro-mechanical switching devices. Fluorescent
lamp ballast units, insufficiently suppressed motors (hair dryers, vacuum
cleaners, drills, etc.) are found everywhere in the public power supply. All of these are
primarily inductive loads which generate interference when switched on or off. EFT
events, can cause microprocessor units to malfunction or reset, with corresponding
disruption to normal operation.
- Power Frequency and Pulse Magnetic Fields
AC current generates a steady magnetic field so that equipment, such as monitors,
close to AC power lines could suffer interference.
Lightning strokes or short circuit fault currents in the power network can generate
high level short duration magnetic fields.
- Voltage Dips/Interrupts
Voltage failures occur following switching operations, short-circuits, response of
fuses and when running up heavy loads.
The quality of the electrical power supply is increasingly becoming a central topic
of discussion. The interference sources in the mains, caused by electronic power
control with non-linear components e.g. thyristors are used more frequently in domestic
appliances such as hotplates, heating units, washing machines, television
sets, economy lamps, PCs and industrial systems with speed-controlled drives.
- Combination Wave Generator (CWG)
Surge events can be generated by lightning phenomena, switching transients or the
activation of protection devices in the power distribution system. A surge itself is
influenced by the propagation path taken so that impulses from the same event may
have different forms depending upon where a measurement is taken. Combination
Wave Generators (CWG) simulate a surge event in power lines close to or within
buildings. Mostly the disturbances are tolerable because they are single events.
- Common Mode
Common mode disturbances originate from power line currents and return leakage
currents in the earthing system. The disturbances are transmitted into equipment
interfaces through capacitive, inductive or resistive coupling. The interference can
appear on power and signal ports. Disturbance levels can be relatively high compared
to the nominal value but are usually only of short duration.
- Voltage Variations
Voltage variations are caused by continuously varying loads connected to the power
network. The voltage change takes place over a short period of time and depends
upon the load. Abrupt variations have the characteristic of a voltage dip with aslow
return to nominal voltage.
International Electrotechnical Committee (IEC)
IEC 61000-4-2 (Ed2:2008): Testing and measurement techniques - Electrostatic discharge
IEC 61000-4-4 (Ed2:2004): Testing and measurement techniques - Electrical fast
transient / burst immunity test.
IEC 61000-4-5 (Ed2:2005): Testing and measurement techniques - Surge immunity
IEC 61000-4-8 (Ed2:2009): Testing and measurement techniques - Power frequency
magnetic field immunity test.
IEC 61000-4-9 (Ed1.1:2001): Testing and measurement techniques - Pulse magnetic
field immunity test.
IEC 61000-4-11 (Ed2:2004): Testing and measurement techniques - Voltage dips, short
interruptions and voltage variations immunity tests.
IEC 61000-4-16 (Ed1.2:2009): Testing and measurement techniques - Test for immunity
to conducted, common mode disturbances in the frequency range 0Hz to 150kHz.
IEC 61000-4-29 (Ed1:2000): Testing and measurement techniques - Voltage dips, short
interruptions and voltage variations on d.c. input power port immunity tests.
European Standard (EN)
The same standards are applicable as for IEC (see above).
International Telecommunications Union (ITU)
K.44 (2003): Resistibility tests for telecommunications equipment exposed to overvoltages
and overcurrents - Basic recommendation
K.20 (2000): Resistibility of telecommunication equipment installed in a telecommunications
centre to overvoltages and overcurrents
K.21 (2003): Resistibility of telecommunication equipment installed in customer premises
to overvoltages and overcurrents.
K.45 (2003): Resistability of telecommunication equipment installed in the access and
trunck networks to overvoltages and overcurrents.
American National Standards Institute (ANSI)
C62.41 (1991): IEEE Recommended Practice on Surge Voltages in Low-Voltage AC
- ANSI/IEEE C62.41
- EN 61000-4-11
- EN 61000-4-12
- EN 61000-4-29
- EN 61000-4-4
- EN 61000-4-5
- EN 61000-4-8
- EN 61000-4-9
- EN 61000-6-1
- EN 61000-6-2
- EN 61543
- IEC 60255-22-5
- IEC 61000-4-11
- IEC 61000-4-12
- IEC 61000-4-29
- IEC 61000-4-4
- IEC 61000-4-5
- IEC 61000-4-8
- IEC 61000-4-9
- IEC 61008-1
- IEC 61009-1
- IEC 61326
- IEC 61850-3
- IEEE 1547
- ITU-T K.20
- ITU-T K.21
- ITU-T K.45
- UL 1741